Abstract：During the semiconductor device electrical method thermal resistance testing process, the error caused by current switching is an important factor affecting the accuracy of measurement, which could not be evaluated effectively now.On the basis of error principle analysis, a double-chip circuit was designed to avoid current switching, and a junction temperature reference value without switching error was obtained, achieving effective evaluation of instrument testing results. The results show that this method can quantitatively evaluate the switching process error of thermal resistance testers, and has good practical significance in measuring thermal resistance testers.
作者简介: 李灏(1989-),河北辛集人,中国电子科技集团公司第十三研究所工程师,主要研究方向为电磁计量。Email:lh3810@163. com
引用本文:
李灏,刘岩,翟玉卫,丁晨,丁立强,吴爱华. 电学法热阻测试切换误差评估方法研究[J]. 计量学报, 2023, 44(7): 1059-1063.
LI Hao,LIU Yan,ZHAI Yu-wei,DING Chen,DING Li-qiang,WU Ai-hua. The Research on Method for Evaluating the Switching Error in Electrical Thermal Resistance Test. Acta Metrologica Sinica, 2023, 44(7): 1059-1063.
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