Research on Diopter Measurement Based on Extended Broadband optical Double Grating Interference
LI Tian-hao1,2,HE Yong1,2,HAN Zhi-gang2,XÜ Hai-fei1
1. School of Electronic Engineering and Optoelectronic Technology, Nanjing University of Science and Technology, Nanjing, Jiangsu 210094, China
2. Key Laboratory of Advanced Solid Laser Industry and Information Technology Ministry, Nanjing University of Science and Technology,Nanjing, Jiangsu 210094, China
Abstract:A diopter measurement based on the double grating system with extended broadband light is proposed. Based on Talbot effection and Moire effection, the intensity distribution formula of interference under extended monochromatic light and extended polychromatic light is derived. As it shows that if the distance from the light to the first grating and the distance from the second grating to the screen is equal, the intensity distribution of the interference won’t be related to the wavelength of the light. Besides the influence of double grating system parameters on the contrast of Moire fringe under extended light is analyzed. The results show that when the width of light is 4mm, the grating period is 0.2mm, the angle between two gratings is 1.9°, and the space distance between two gratings is 6.5mm, the clear interference fringe can be obtained. A diopter measurement system is constructed to measure the lens with diopter of -1m-1, -3m-1, 1m-1 and 3m-1. The peak-to-valley deviation of measurements is 0.0064m-1, which is the 0.28% of the average measurement results. The experiment result shows that the lens diopter can be measured with double grating system using extended broadband light source accurately and cheaply.
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