Abstract：Spectral emissivity of materials is an important parameter to characterize the spectral radiation properties of materials. When measuring the emissivity of material, the spectral response of the spectrometer is generally linear, and the accuracy of the measurement results is greatly affected by the nonlinear error in the data processing. Therefore, it is necessary to measure the linearity of the response of the instrument to determine the linear range of the spectral response. The method to measure the linearity of the spectrometer is introduced, by testing the energy of the different temperature of the Fourier infrared spectrometer, the linear range of DTGS and InGaAs two detectors is determined.
［1］王宗伟,戴景民,何小挖,等.超高温FTIR光谱发射率测量系统的线性度分析［J］.光谱学与光谱分析,2012,32,(2):313-316.
［2］王新北.基于傅里叶红外光谱仪的材料光谱发射率测量技术的研究［D］.哈尔滨:哈尔滨工业大学,2007.
［3］E307-72(reapproved2008),Standard Test method for normal Spectral emittance at elevated temperatures［S］.
［4］Hanssen L, Mekhontsev S, Khromchenko V. Infrared spectral emissivity characterization Facility at NIST［J］. Proceedings of SPIE,2004,5405:285~293.
2015, Vol. 36 
