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计量学报  2015, Vol. 36 Issue (6): 575-578    DOI: 10.3969/j.issn.1000-1158.2015.06.04
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计量型紫外显微镜微纳米线宽测量技术的研究
尹传祥1,高思田2,赵贤云1,李琪2,施玉书2,李伟3,卢荣胜1
1. 合肥工业大学, 安徽  合肥 230009
2. 中国计量科学研究院, 北京 100029
The Research of Micro-Nano Linewidth Measurement Technology on Metrological Ultraviolet Microscope
YIN Chuan-xiang1,GAO Si-tian2,ZHAO Xian-yun1,LI Qi2, SHI Yu-shu2,LI Wei2,LU Rong-sheng1
1. Hefei University of Technology, Hefei,  Anhui 230009, China
 2. National Institute of Metrology, Beijing 100029, China
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