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计量学报  2017, Vol. 38 Issue (2): 145-148    DOI: 10.3969/j.issn.1000-1158.2017.02.04
  几何量计量 本期目录 | 过刊浏览 | 高级检索 |
采用HRTEM对石墨烯材料单层厚度测量的研究
王琛英1,2,3,景蔚萱2,蒋庄德1,2,3,林启敬1,2,韩枫1,2,李磊1,2
1. 高端制造装备协同创新中心, 陕西 西安710049
2. 西安交通大学 机械制造系统工程国家重点实验室, 陕西 西安 710054
3. 苏州纳米科技协同创新中心, 江苏 苏州 215123
The Measurement of Single-layer Thickness of Graphene Materials by High Resolution Transmission Electron Microscopy
WANG Chen-ying1,2,3,JING Wei-xuan2,JIANG Zhuang-de1,2,3, LIN Qi-jing1,2,HAN Feng1,2,LI Lei1,2
1. Collaborative Innovation Center of High-End Manufacturing Equipment, Xi’an, Shaanxi 710049, China
2. State Key Laboratory for Manufacturing Systems Engineering, Xi’an Jiaotong University, Xi’an, Shaanxi 710054, China
3. Collaborative Innovation Center of Suzhou Nano Science and Technology, Suzhou, Jiangsu 215123, China
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