1.Fujian Institute of Metrology,Fuzhou,Fujian 350003,China
2.Anhui Institute of Metrology,Hefei, Anhui 230051,China
3.National Institute of Metrology,Beijing 100029,China
Abstract：The half-value layer measurement is required in various diagnostic X-ray radiation source verification regulations or calibration specifications, and half value layer measuring instruments are also widely used, but the calibration method of half value layer measuring instruments has not been clear. The main influencing factors in the calibration of the half value layer measuring instrument are discussed. The results show that the detector angle has the greatest influence on the measurement results. Therefore, the half value layer measuring instrument to be calibrated should be placed in the center of the test plane during calibration, and the angle deviation should not exceed ±1°.
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2023, Vol. 44 
