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计量学报  2022, Vol. 43 Issue (12): 1645-1650    DOI: 10.3969/j.issn.1000-1158.2022.12.20
  声学计量 本期目录 | 过刊浏览 | 高级检索 |
X射线衍射法测量电容传声器的膜片张力
李旭1,2,何龙标1,祝海江2,张小丽1,冯秀娟1,牛锋1
1.中国计量科学研究院, 北京 100029
2.北京化工大学,北京 100029
Measurement of Diaphragm Tension of Condenser Microphone by X-ray Diffraction
LI Xu1,2,HE Long-biao1,ZHU Hai-jiang2,ZHANG Xiao-li1,FENG Xiu-juan1,NIU Feng1
1. National Institute of Metrology, Beijing 100029, China
2.  Beijing University of Chemical Technology, Beijing  100029,China
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