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计量学报  2021, Vol. 42 Issue (2): 184-188    DOI: 10.3969/j.issn.1000-1158.2021.02.09
  光学计量 本期目录 | 过刊浏览 | 高级检索 |
TES用超导薄膜制备及特性研究
刘贤文1,徐骁龙2,李劲劲2,王雪深2,钟青2,曹文会2,白剑楠1,张硕3,刘想靓2,司坤宇1,周哲海1,甘海勇2
1.北京信息科技大学 仪器科学与光电工程学院, 北京 100192
2.中国计量科学研究院, 北京 100029
3.上海科技大学, 上海 201210
Deposition and Characterization of Thin Films for Superconducting Transition Edge Sensor
LIU Xian-wen1,XU Xiao-long2,LI Jin-jin2,WANG Xue-shen2,ZHONG Qing2,CAO Wen-hui2,BAI Jian-nan1,ZHANG Shuo3,LIU Xiang-liang2,SI Kun-yu1,ZHOU Zhe-hai1,GAN Hai-yong2
1. School of Instrumentation Science and Opto Electronics Engineering, Beijing Information Science and Technology University, Beijing 100192, China
2. National Institute of Metrology, Beijing 100029, China
3.Shanghai Tech University, Shanghai 201210, China
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