Effects of Incident Angle Deviation on Film Thickness Measurement Using Extinction Ellipsometry
DU Chenhuo, ZHANG Shu, HU Jiacheng, PI Lei, SHI Yushi
Acta Metrologica Sinica . 2026, (4): 475 -481 .  DOI: 10.3969/j.issn.1000-1158.2026.04.01