[1]Takahashi A, Miwa N. An experimental verification of the compensation of length change of line scales caused by ambient air pressure[J].Meas Sci Technol,2010,21:1-7.
[2]Takahashi A,et al.WGDM-7 Preliminary comparison on nanometrology According to the rules of CCL key comparisons[R].Braunschweig,PTB,0829,2003.
[3]叶孝佑,高宏堂,邹玲丁,等.2m比长仪纳米级高精度刻线自动瞄准系统[J].计量学报,2010,31(6A):107-111.
[4]Pieles H,et al.Interferometric Equipment for Precise Measurements of Line Standards and their Thermal Expansion[J].MAPAN-Journal of Metrology Society of India, 1995,10(2):65-73.
[5]叶孝佑,甘晓川,常海涛,等.提高环境参量法测量空气折射率精度的研究[J].计量学报,2008,29(5A):70-73.
[6]叶孝佑,高宏堂,邹玲丁,等.2m激光干涉比长仪研制[R].北京:中国计量科学研究院,SJG-0301,2010.
[7]JJF 1059—1999,测量不确定度评定与表示[S]. |