[1]唐统一.近代电磁测量[M].北京:中国计量出版社,1992.
[2]Jones G R,Elmquist R E. Characterization of loading effects in precision 1Ω resistors[C]//Conf Digest of CPEM 2008,Broomfield ,2008.
[3]胡毅飞,赵伟,朱珠,等.直流数字纳伏表校准装置研究[J].计量学报,2007,28(1):5-9.
[4]Schumacher B. CCEM-K10 Key Comparison of Resistance Standards at 100Ω[C ]//Conf Digest of CPEM 2008, Broomfield,2008.
[5]任子生,施大申.电阻负载系数的精密测量[J].电测与仪表,2000,37(415):19-21.
[6]Tadros N N. Investigation into the effect of loading on the NIS primary group of standard resistors [C]//Instrumentation and Measurement Technology Conference,St Paul, MN,1998.
[7]董亮,林鸿,张金涛.基于LabVIEW8.0的铜电阻温度系数的测量方法研究[J].计量技术,2008,(7):13-16.
[8]李艳强.基于LabVIEW的标准电阻温度系数测试系统[J].机械工程与自动化,2012,174(5):155-157.
[9]张钟华,李辰,贺青,等.能量天平研究进展[J].计量学报,2014,35(4):305-310.
[10]Lan J,Zhang Z H,Li Z K,et al. High precision measurement of the load effect of the resistor[C]//Conf Digest of CPEM 2012,Washington D C,2012. |