|
|
|
| Study on Surface True Temperature Measurement of Low-emission Materials Based on Active Infrared Dual-laser Reflection Radiation Thermometry |
|
|
|
|
Abstract The active infrared dual-laser reflection technique possesses a distinct advantage for surface true temperature measurement in situations where the material emissivity is unknown. However, foreign institutions lack sufficient understanding of the correlation between the surface radiation characteristics of calibration samples and measurement results in the active infrared dual-laser reflection temperature measurement model, while domestic experimental research on this topic remains extremely scarce. In this study, a set of experimental systems for surface true temperature measurement based on the active infrared dual-laser reflection method was established using 980nm and 1550nm lasers, and the influence characteristics of diffuse and specular reflection calibration samples on temperature measurement deviation were investigated. Surface true temperature measurements were conducted in a temperature range near 1073K, which were compared with actual object surface temperatures extrapolated from thermocouples. The results demonstrate that for the selected materials, the relative error between these two temperatures falls within 1% to 3%, thereby confirming the feasibility of utilizing active infrared dual-laser reflection radiation technology for surface real temperature measurements.
|
|
Received: 28 October 2024
Published: 03 April 2025
|
|
|
|
|
|
|
2025, Vol. 46 
