Acta Metrologica Sinica  2013, Vol. 34 Issue (2): 184-186    DOI: 10.3969/j.issn.1000-1158.2013.02.17
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The Wavelet Projection Pursuit Regression Method of Near-infrared Spectroscopy Calibration
ZHOU Yang1,2,DAI Shu-guang1,LV Jin2,LIU Tie-bing2,SHI Yang2,CHEN Cai2,LI Bo-bin3
1.College of Optics & Electronics Engineering, University of Shanghai for Sci and Tech, Shanghai 200093, China;
2.Laboratory of NIR- Applications, Zhejiang University of Sci  and Tech, Hangzhou, Zhejiang 310023, China;
3. National Quality Supervision and Testing Center for Rice Wine, Shaoxing, Zhejiang 310027, China
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