Acta Metrologica Sinica  2024, Vol. 45 Issue (11): 1671-1680    DOI: 10.3969/j.issn.1000-1158.2024.11.11
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Strip Surface Defect Detection Based on Improved YOLOv5
YANG Wei1,2,YANG Jun2,XU Congyuan2
1.School of Computer Science and Technology, Zhejiang Sci-Tech University, Hangzhou, Zhejiang 310018, China
2.School of Information Science and Engineering, Jiaxing University, Jiaxing, Zhejiang 314001, China
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