Acta Metrologica Sinica  2024, Vol. 45 Issue (9): 1262-1272    DOI: 10.3969/j.issn.1000-1158.2024.09.03
Current Issue | Archive | Adv Search |
The Methods and Prospects of Temperature Measurement for Chip Development in Micro-nano Meter Scale
WU Feixiang1,2,XING Li2,FENG Xiaojuan2,ZHANG Jintao2,SUN Jian1
1. College of Mechanical and Electrical Engineering, China Jiliang University, Hangzhou, Zhejiang 310018, China
2. Division of Thermophysics, National Institute of Metrology, Beijing 100029, China
Copyright © Editorial Board of Acta Metrologica Sinica
Supported by:Beijing Magtech