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| Analysis of The Measurement Comparison Results of On-wafer S-parameters |
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Abstract As the leading laboratory, the 13th Research Institute of China Electronics Technology Group Corporation carried out the measurement comparison of on-wafer S-parameters, summarized and analyzed the measurement results of on-wafer S-parameters submitted by the joined laboratories, and evaluated the measurement results of each laboratory with En. Through the measurement comparison of the on-wafer S-parameters, the accuracy and reliability of the transmission of the quantities are ensured, especially the main sources of the measurement uncertainty of the on-chip S-parameters are unified. At the same time, it also provides the industry with a comparison platform for the consistency of on-chip S-parameter measurement.
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Received: 23 January 2024
Published: 26 September 2024
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2024, Vol. 45 
