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An Infrared Temperature Measurement Compensation Method Based on Emissivity Correction Model |
MI Songtao1,ZHANG Yucun1,FU Xianbin2,YAN Fang1,KONG Tao2 |
1. Yanshan University, Qinhuangdao, Hebei 066300, China
2. Hebei University of Environmental Engineering, Qinhuangdao, Hebei 066300, China |
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Abstract At present, the infrared temperature measurement method is affected by the surface emissivity of the measured object, which makes the measurement results have errors. By analyzing the influence of surface roughness on surface infrared emissivity, an infrared temperature compensation method based on emissivity correction model is proposed. Firstly, an infrared temperature compensation algorithm for surface roughness correction is established based on the principle of infrared temperature measurement. Secondly, in order to determine the surface emissivity correction in the infrared temperature compensation method, a rough surface emissivity correction model is established by two-scale rough surface. Finally, in order to verify the feasibility of the proposed infrared temperature measurement compensation method, the measurement results before and after the compensation algorithm are compared in the infrared temperature measurement experiment of friction stir welding seam. The maximum error of infrared temperature measurement is reduced from 9.64℃ to 2.97℃, and the average measurement error is reduced from 3.57℃ to 0.71℃, indicating that the proposed infrared compensation temperature measurement method can improve the accuracy of infrared temperature measurement.
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Received: 08 October 2022
Published: 21 February 2024
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Fund:The central government guides local science and technology development foundation;the Natural Science Foundation of Hebei Province, China |
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