Acta Metrologica Sinica  2024, Vol. 45 Issue (1): 1-8    DOI: 10.3969/j.issn.1000-1158.2024.01.01
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Test Method of In-plane Thermal Conductivity of Thin Films Based on Laser Thermal Imaging
CHEN Mingxin,HOU Dexin,YE Shuliang
Institute of Industry and Trade Measurement Technique, China Jiliang University, Hangzhou, Zhejiang 310018, China
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