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| The Research on Method for Evaluating the Switching Error in Electrical Thermal Resistance Test |
| LI Hao,LIU Yan,ZHAI Yu-wei,DING Chen,DING Li-qiang,WU Ai-hua |
| The 13th Research Institute, CETC, Shijiazhuang,Hebei 050051, China |
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Abstract During the semiconductor device electrical method thermal resistance testing process, the error caused by current switching is an important factor affecting the accuracy of measurement, which could not be evaluated effectively now.On the basis of error principle analysis, a double-chip circuit was designed to avoid current switching, and a junction temperature reference value without switching error was obtained, achieving effective evaluation of instrument testing results. The results show that this method can quantitatively evaluate the switching process error of thermal resistance testers, and has good practical significance in measuring thermal resistance testers.
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Received: 06 January 2022
Published: 17 July 2023
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2023, Vol. 44 
