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Acta Metrologica Sinica  2014, Vol. 35 Issue (5): 494-498    DOI: 10.3969/j. issn. 1000-1158.2014.05.18
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The Sinewave Fit Algorithm Based on Total Least-square Method with Non-uniform Sampling
LIANG Zhi-guo1ZHUZhen-yu2
1. Ghangcheng Institute of Metrology and Measurement, Beijing 100095, China;
2. College of Precision Instrument and Opto-electronics Engineering, Tianjin University, Tianjin 300072, China
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