Acta Metrologica Sinica  2019, Vol. 40 Issue (6A): 8-11    DOI: 10.3969/j.issn.1000-1158.2019.6A.002
Current Issue | Archive | Adv Search |
A Calibration Method for Large-scale Imaging Probe Measuring Machines Based on Line Scale Stitching
WANG Bing-he, KANG Yan-hui, SUN Shuang-hua
National Institute of Metrology, Beijing 100029, China
Download: PDF (651 KB)   HTML (1 KB) 
Export: BibTeX | EndNote (RIS)      
Abstract  In order to realize full range calibration of the large-scale imaging probe measuring machines scientifically, a method based on line scale stitchingwas developed. The method using the good repeatability of the imaging probe and the grating scale to get smaller stitching error through specific layout of the line scale. The length measurement error of the full range of XY measuring plane can be detected through this stitching method, which can ensure the accuracy of the whole measuring range. A demonstration for full range calibration of large-scale imaging probe measuring machine was provided, and the experiments and uncertainty analysis verified the feasibility of the method.
Key wordsmetrology      imaging probe measuring machine, large-scale, stitching, line scale     
Received: 20 September 2019     
PACS:  TB921  
Service
E-mail this article
Add to my bookshelf
Add to citation manager
E-mail Alert
RSS
Articles by authors
WANG Bing-he
KANG Yan-hui
SUN Shuang-hua
Cite this article:   
WANG Bing-he,KANG Yan-hui,SUN Shuang-hua. A Calibration Method for Large-scale Imaging Probe Measuring Machines Based on Line Scale Stitching[J]. Acta Metrologica Sinica, 2019, 40(6A): 8-11.
URL:  
http://jlxb.china-csm.org:81/Jwk_jlxb/EN/10.3969/j.issn.1000-1158.2019.6A.002     OR     http://jlxb.china-csm.org:81/Jwk_jlxb/EN/Y2019/V40/I6A/8
Copyright © Editorial Board of Acta Metrologica Sinica
Supported by:Beijing Magtech