Acta Metrologica Sinica  2019, Vol. 40 Issue (6): 975-979    DOI: 10.3969/j.issn.1000-1158.2019.06.06
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Study of Temperature States Influence on the Accuracy of Large Size Measuring Devices
LI Ting1,2,LI Jian-shuang2,MIAO Dong-Jing2,LI Lian-Fu2,LIU Xue-de2,3
1. Hunan Institute of Metrology and Test,Hunan, Changsha 410007, China
2. National Institute of Metrology,Beijing 100029, China
3. Tianjin University,Tianjin 300072,China
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Abstract  Large-scale measuring device has a wide measuring range, the measurement accuracy of the device is affected by many factors, among them, the change of the environmental conditions of the large size measuring device will affect its measurement accuracy. Based on the indoor 80m length standard device of National Institute of Metrology, China, the measurement accuracy experiment of 10m, 30m, 70m in the air conditioning temperature control state and natural temperature state (not controlled temperature) were designed to study, the refractive index compensation errors in the air-conditioning temperature control state were 7.0μm, 10.5μm, and 21.0μm, and the refractive index compensation errors in the natural temperature state were 2.5μm, 2.9μm, and 3.9μm respectively. The experimental results show that the large-scale measuring device can obtain higher measurement accuracy under natural conditions, and when the measuring range is greater than 30m, the measurement accuracy can be better than 10-7 magnitude.
Key wordsmetrology      large size measuring device      laser interferometer      refractive index compensation      temperature condition      measurement accuracy     
Received: 14 December 2018      Published: 10 October 2019
PACS:  TB921  
Corresponding Authors: Jian-Shuang LI     E-mail: lijiansh@nim.ac.cn
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LI Ting
LI Jian-shuang
MIAO Dong-Jing
LI Lian-Fu
LIU Xue-de
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LI Ting,LI Jian-shuang,MIAO Dong-Jing, et al. Study of Temperature States Influence on the Accuracy of Large Size Measuring Devices[J]. Acta Metrologica Sinica, 2019, 40(6): 975-979.
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http://jlxb.china-csm.org:81/Jwk_jlxb/EN/10.3969/j.issn.1000-1158.2019.06.06     OR     http://jlxb.china-csm.org:81/Jwk_jlxb/EN/Y2019/V40/I6/975
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