Acta Metrologica Sinica  2019, Vol. 40 Issue (5): 776-779    DOI: 10.3969/j.issn.1000-1158.2019.05.06
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Optical Path Multiplication Measurement Based on Error Elimination Principle
LIU Hong-guang1,LI Qing1,LI Ling-mei1,CHEN Jie1,LI Jun-feng2,LU Rui-jun1
1. Tianjin Institute of Metrological Supervision and Testing, Tianjin 300192, China
2. National Institute of Metrology, Beijing 100029, China
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