Abstract The exact value of the photon mass attenuation coefficient of a material needs to provide basic data for different fields.The monochromatic X-ray radiation device is an ideal device for the study of mass attenuation coefficient (μ/ρ) because the energy of the device is continuous and can be reconciled with the number of measured photons.The mass attenuation coefficient measurement method of Zn samples in the range of 8~20keV near the K absorption edge (9~11KeV) with 0.1keV step based on a monochromatic X-ray device is studied, and the experimental measurement values are compared with the NIST theoretical values.The results show that there is a maximum deviation near the K absorption edge jump, and the deviation decreases when moving away from the absorption edge.The measured curves are basically consistent with NIST-XCOM and NIST-FFAST curves, and the maximum deviation between the measured values and the theoretical values of NIST-XCOM is less than 10.51%.
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2024, Vol. 45 
