Abstract The measurement of emissivity distribution characteristics is an important basis for evaluating the radiation uniformity of large-aperture radiation sources, but the related research is relatively scarce at present. Therefore, a measurement system for the emissivity distribution characteristics of the infrared radiation source is designed and built based on complete hemispherical laser integrated reflection scheme. The performance of the measurement system is studied, the stability of the laser light source subsystem is evaluated, and the experiment of measuring the emissivity distribution characteristics of surface radiation source is carried out at 3 W laser power. The results show that the measurement system has good stability. Taking the surface of standard gold plate as the research object, the repeatability of multiple measurement results is 0.30%; The experimental measurement of emissivity distribution of carbon based surface radiation source is carried out, and the distribution cloud map of emissivity of surface radiation source is obtained, the uniformity of emissivity is 98.1%.
LIU Guang-yu,HUAN Ke-wei,AN Bao-lin, et al. Study on the Measurement of the Emissivity Distribution of Flat PlateRadiation Source Based on the Integrating Sphere Reflection Method[J]. Acta Metrologica Sinica, 2023, 44(4): 503-507.
Gene J, Jeon M Y, Lim S D. Reflectometers for Absolute and Relative Reflectance Measurements in the Mid-IR Region at Vacuum［J］. Sensors, 2021: 21(4): 1169.
Zhang S K, Cai J, Yang Y J. Research and Progress on Material spectral Emissivity Measurement［J］. Industrial metrology, 2013, 23 (6): 5-9.
Xiong B Shi X J, Chen H M, et al. Emissivity Measurement of Aeroengine Turbine Blade［J］. Gas turbine test and research, 2011, 24 (2): 45-48.
Shao C T, H K W, Li Z B, et al. Research on Integrated Blackbody Emissivity Measurement Based on Laser Integral Sphere Reflectometry［J］.Acta Metrologica Sinica, 2019, 40 (3): 427-431.
［12］
Hanssen L, Mekhontsev S N, Khromchenko V B, et al. Infrared Spectral Emissivity Characterization Facility at NIST［C］//Thermosense XXVI. Orlando, FL, United States, 2004.
［13］
Zeng J N, Hanssen L. An infrared laser-based reflectometer for low reflectance measurements of samples and cavity structures［C］//Reflection, Scattering, and Diffraction from Surfaces. San Diego, California, United States, 2008.
Han W,Liu Y,Du Lei,et al. Influence of Emissivity of Infrared Thermal Results of Semiconductor Device［J］.Acta Metrologica Sinica, 2021, 42(1): 35-40.
Song X Y, Dong W, Pan Y J, et al. The infrared spectral emissivity measurement of a graphite material in a high temperature range of 1000~1500℃ using integrated blackbody principle［J］. Journal of infrared and millimeter wave, 2021, 40(2): 204-213.
Yang B X, Du Y M, Xiao Q, et al.Study of Effecting Factors on Emissivity Measurement by Integrating Sphere with Monte Carlo Simulation［J］. Remote sensing technology and application, 2017, 32 (1): 149-157.
Liu B, Zheng W, Li H Y. Research and Progress on Material Surface Emissivity Measurement［J］. Infrared technology, 2018, 40 (8): 725-732.
Hanssen L M, Mekhontsev S N, Khromchenko V B. Validation of the Infrared Emittance Characterization of Materials Through Intercomparison of Direct and Indirect Methods［J］. International Journal of Thermophysics, 2010, 31: 1972-1978.
Zhang Y F, Dai J M, Zhang Y, et al. Correction Method for Infrared Spectral Emissivity Measurement System Based on Integrating Sphere Reflectometer［J］. Spectroscopy and spectral analysis, 2013, 33(8): 2267-2271.
2023, Vol. 44 
