测量条件对A/D动态有效位数评价的影响

doi:10.3969/j.issn.1000-1158.2022.04.15

Abstract
Figure/Table
References (19)
Related Citation (15)

Download: PDF (4979 KB) HTML (1 KB)
Export: BibTeX | EndNote (RIS)

Abstract Aiming at the influence of measurement conditions on the error of the effective bits of A/D converters by the sine fitting method, a study of the fitting error bounds is carried out. The selected condition variables are the A/D bits number, the signals amplitude, the number of signal cycles in sampling sequence, the initial phase, the DC bias, and the number of data points in sampling sequence. The error bounds search is carried out in the dual condition combination method, and the error of dynamic effective bits evaluation via the changes of different conditions is obtained, both the significant influence and the insignificant influence are screened out. Through the study of the influence of the number of A/D bits, the number of signals cycles in sequence, and the number of data points, and the significant law that the error boundary showing the characteristics of the quantization step has been obtained, and the estimation of the boundary point of the quantization step has been obtained by empirical formula. The result can be used to estimate the evaluation error and uncertainty of the dynamic effective bits, and can also be used to select the measurement conditions under the condition of setting the fitting error and uncertainty.

Key words： metrology measurement condition A/D converter dynamic effective bits error bounds quantization sine wave curve fitting

Received: 09 April 2021 Published: 08 April 2022

PACS:

TB973

	Service

	E-mail this article
	Add to my bookshelf
	Add to citation manager
	E-mail Alert
	RSS
	Articles by authors
	LIANG Zhi-guo

Cite this article:

LIANG Zhi-guo. The Influence of Measurement Condition to the Effective Bits Evaluation of A/D in Sine-Fit Method[J]. Acta Metrologica Sinica, 2022, 43(4): 526-535.

URL:

http://jlxb.china-csm.org:81/Jwk_jlxb/EN/10.3969/j.issn.1000-1158.2022.04.15 OR http://jlxb.china-csm.org:81/Jwk_jlxb/EN/Y2022/V43/I4/526

［1］ IEEE Std 1057-1994, IEEE standard for digitizing waveform recorders［S］. 1994.
［2］ JJF 1048-1995 数据采集系统校准规范［S］. 1995.
［3］ JJF 1057-1998 数字存储示波器校准规范［S］. 1998.
［4］ IEEE Std 1241-2010, IEEE Standard for terminology and test methods for analog-to-digital converters［S］. 2010.
［5］ Peetz B E. Dynamic testing of waveform recorders［J］.   IEEE Transactions on Instrumentation and Measurement , 1983, 32(1): 12-17.
［6］ Doerfler D W. Dynamic testing of a slow sample rate high-resolution data acquisition system［J］.   IEEE Transactions on Instrumentation and Measurement , 1986, 35(4): 477-482.
［7］梁志国, 孙璟宇. 评价动态有效位数的述评［J］. 计量学报, 2001, 22(2): 152-155.
Liang Z G, Sun J Y. Discussing about the problems in evaluation of effective bits［J］.   Acta Metrologica Sinica , 2001, 22(2): 152-155.
［8］梁志国, 孙璟宇. 正弦波模型化测量方法及应用［J］. 计测技术, 2001, 21(6): 3-7, 16.
Liang Z G, Sun J Y. Sine wave modeling measuring methods and its applications［J］.   Aviation Metrology & Measurement Technology , 2001, 21(6): 3-7.
［9］梁志国. 基于正弦失真测量的A/D动态有效位数评价［J］. 计量学报, 2014, 35(4): 258-262.
Liang Z G. The evaluation method of effective bits of A/D converters based on sinusoidal distortion measurement［J］.   Acta Metrologica Sinica , 2014, 35(3): 258-262.
［10］桑龙, 陈静. 基于正弦曲线拟合算法的ADC测试改进方法［J］. 电讯技术, 2010, 50(2): 69-72.
Sang L, Chen J. Improved ADC measurement approach based on sine wave fitting［J］.   Telecommunication engineering , 2010, 50(2): 69-72.
［11］林俊武. 高速A/D转换的动态精度研究［D］. 福州: 福州大学, 2005.
［12］ Handel P. Properties of the IEEE-STD-1057 four-parameter sine wave fit algorithm［J］.   IEEE Transactions on Instrumentation and Measurement , 2000, 49(6): 1189-1193.
［13］张智慧. ADC的测量不确定度评估方法研究［D］. 西安: 陕西科技大学, 2015.
［14］梁志国. 正弦波拟合参数的不确定度评定［J］. 计量学报, 2018, 39(6): 888-894.
Liang Z G. The measurement uncertainty of curve-fit parameters of sinusoidal［J］.   Acta Metrologica Sinica , 2018, 39(6): 888-894.
［15］梁志国, 孙璟宇. 动态有效位数评价结果的不确定度［J］. 计量技术, 2000(5): 49-51.
Liang Z G, Sun J Y. Uncertainty of Evaluation Result of Effective Bits［J］.   Measurement Technique , 2000(5): 49-51.
［16］ Chiorboli G, Franco G, Morandi C. Uncertainties in quantization-noise estimates［J］.   IEEE Transactions on Instrumentation and Measurement , 1997, 46(1): 56-60.
［17］梁志国, 朱济杰. 量化误差对周期信号总失真度评价的影响及修正［J］. 仪器仪表学报, 2000, 21 (6): 640-643.
Liang Z G, Zhu J J. The Correction of the Quantization Error of the Evaluation of the Distortion of Periodic Signal［J］.   Chinese Journal of Scientific Instrument , 2000, 21(6): 640-643.
［18］梁志国. 正弦波形参量对A/D有效位数评价的影响［J］. 计量学报, 2017, 38(1): 91-97.
Liang Z G. The influence of Sinusoidal Parameters in Evaluation of Effective Bit of ADC Converts by Curve-fit Method［J］.   Acta Metrologica Sinica , 2017, 38(1): 91-97.
［19］ Deyst J P, Soulders T M, Solomon O M. Bounds on Least-Squares Four-Parameter Sine-Fit Errors Due to Harmonic Distortion and Noise［J］.   IEEE Transaction on Instrumentation & Measurement , 1995, 44 (3): 637-642.