Acta Metrologica Sinica  2022, Vol. 43 Issue (4): 526-535    DOI: 10.3969/j.issn.1000-1158.2022.04.15
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The Influence of Measurement Condition to the Effective Bits Evaluation of A/D in Sine-Fit Method
LIANG Zhi-guo
National Key Laboratory of Science and Technology on Metrology & Calibration, Changcheng Institute of Metrology and Measurement, Beijing 100095, China
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Abstract  Aiming at the influence of measurement conditions on the error of the effective bits of A/D converters by the sine fitting method, a study of the fitting error bounds is carried out. The selected condition variables are the A/D bits number, the signals amplitude, the number of signal cycles in sampling sequence, the initial phase, the DC bias, and the number of data points in sampling sequence. The error bounds search is carried out in the dual condition combination method, and the error of dynamic effective bits evaluation via the changes of different conditions is obtained, both the significant influence and the insignificant influence are screened out. Through the study of the influence of the number of A/D bits, the number of signals cycles in sequence, and the number of data points, and the significant law that the error boundary showing the characteristics of the quantization step has been obtained, and the estimation of the boundary point of the quantization step has been obtained by empirical formula. The result can be used to estimate the evaluation error and uncertainty of the dynamic effective bits, and can also be used to select the measurement conditions under the condition of setting the fitting error and uncertainty.
Key wordsmetrology      measurement condition      A/D converter      dynamic effective bits      error bounds      quantization      sine wave      curve fitting     
Received: 09 April 2021      Published: 08 April 2022
PACS:  TB973  
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LIANG Zhi-guo
Cite this article:   
LIANG Zhi-guo. The Influence of Measurement Condition to the Effective Bits Evaluation of A/D in Sine-Fit Method[J]. Acta Metrologica Sinica, 2022, 43(4): 526-535.
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http://jlxb.china-csm.org:81/Jwk_jlxb/EN/10.3969/j.issn.1000-1158.2022.04.15      OR     http://jlxb.china-csm.org:81/Jwk_jlxb/EN/Y2022/V43/I4/526
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