Acta Metrologica Sinica  2021, Vol. 42 Issue (12): 1585-1595    DOI: 10.3969/j.issn.1000-1158.2021.12.06
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Quantum-inspired Enhancement Algorithms of Electron Microscope Images
CUI Fa-yi1,2
1. Key Lab of Measurement Technology & Instrumentation of Hebei Province, Yanshan University, Qinhuangdao, Hebei 066004, China
2. School of Electrical Engineering, Yanshan University,Qinhuangdao, Hebei 066004, China
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