Acta Metrologica Sinica  2021, Vol. 42 Issue (1): 16-19    DOI: 10.3969/j.issn.1000-1158.2021.01.03
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Establishment on Standard Device for Measuring Retroreflection Coefficient
ZHENG Chun-di, FENG Guo-jin, LIANG Feng-chen, ZHANG Qiao-xiang, WU Hou-ping, LIU Zi-long, GAN Hai-yong
National Institute of Metrology, Beijing 100029, China
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Abstract  Based on the illuminance method, a standard device for measuring the coefficient of retroreflection has been established in National Institute of Metrology. The structure and principle of the device are described in detail, and the main factors affecting the level of uncertainty of measurement are analyzed. The final measurement range covers 0.05~1999.00 cd·lx-1·m-2. The measurement uncertainty Urel is 3.0%~8.2%,k=2.
Key wordsmetrology      retroreflection coefficient      standard device      illuminance method      uncertainty     
Received: 05 September 2019      Published: 19 January 2021
PACS:  TB96  
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ZHENG Chun-di
FENG Guo-jin
LIANG Feng-chen
ZHANG Qiao-xiang
WU Hou-ping
LIU Zi-long
GAN Hai-yong
Cite this article:   
ZHENG Chun-di,FENG Guo-jin,LIANG Feng-chen, et al. Establishment on Standard Device for Measuring Retroreflection Coefficient[J]. Acta Metrologica Sinica, 2021, 42(1): 16-19.
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http://jlxb.china-csm.org:81/Jwk_jlxb/EN/10.3969/j.issn.1000-1158.2021.01.03     OR     http://jlxb.china-csm.org:81/Jwk_jlxb/EN/Y2021/V42/I1/16
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