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Research on Hysteresis of the High-precision Thin-film Platinum Tesistance Thermometers |
ZHANG Heng1,ZENG Fan-chao2,WEN Chang-jun1,HAO Xiao-peng3,SUN Jian-ping3,FU Cheng-yu2 |
1. Hubei University of Technology, Wuhan, Hubei 430068, China
2. Hubei Instiute of Measurement and Testing,Wuhan, Hubei 430223, China
3.National Institute of Metrology, Beijing 100029, China |
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Abstract Hysteresis is one of the sources of the measurement uncertainty of industrial platinum resistance thermometers(IPRTs). Eight high-precision platinum resistance thermometers(PRTs) were selected to study the influence of the measurement uncertainty due to the hysteresis. The temperature range was between -50℃ and 150℃, and three temperature span thermal hysteresis experiments were carried out. Two standard methods were used to get the thermal hysteresis values which were the change of resistance at the triple point of water and at the midpoint in the temperature range. The experimental results showed that the influence of thermal hysteresis of four thin-film PRTs increases with the increase of temperature range span under the two standard methods, the largest thermal hysteresis measured by IEC 60751 standard method was 14.2mK, and the maximum thermal hysteresis measured by ASTM E644 standard was 20.5mK. The maximum thermal hysteresis measured by the IEC 60751 standard method and the ASTM E644 standard method was 1.1mK and 0.9mK, respectively, when the four platinum wire PRTs were measured at a temperature range of -50℃ to 150℃. The platinum wire PRTs has significantly lower thermal hysteresis than the thin-film PRTs.
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Received: 26 March 2019
Published: 10 October 2019
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