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Weak Signal Measurement in Thermoreflectance Temperature Testing Based on Stochastic Resonance |
ZHAI Yu-wei,ZHENG Shi-qi,LIU Yan,LI Ying-hui,LIANG Fa-guo |
The 13th Research Institute of CETC, Shijiazhuang, Hebei 050051, China |
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Abstract A method of using stochastic resonance to improve the temperature resolution of CCD based thermoreflectance was proposed. A specific quantization rule of CCD detector was supposed, the principles of stochastic resonance work on the nonlinearly CCD detector were analyzed, the measurement results by CCD detector after applying stochastic resonance were calculated in theory. A simulation program based on LabVIEW was developed to simulate the effects of kinds of stochastic noise on measuring weak signals, and the simulation results were consistent with the calculation ones. The simulation also showed that the weaker the noise intensity is, the lager the errors is, when the noise intensity was more than 1, the simulation results were nearly equal to the accurate ones. A thermoreflectance apparatus with a theoretical resolution 1.035℃ was installed, a 0.5℃ weak signal was measured, the results were between 0.455~0.673℃, it is confirmed that stochastic resonance can improve the weak signal measurement capability of CCD detector.
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Received: 22 May 2018
Published: 10 June 2019
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