[1]Sené M, Gilmore I, Janssen J T. Metrology is key to reproducing results[J]. Nature,2017,547(7664):397-399.
[2]Terry Quinn. From Artefacts to Atoms: the BIPM and the search for ultimate measurement standards[M]. New York:Oxford University Press, 2012.
[3]Novoselov K S, Geim A K, Morozov S V, et al. Electric field effect in atomically thin carbon films [J].Science,2004,306( 5296):666-669.
[4]任玲玲. 石墨烯等碳基纳米材料NQI技术研究、集成与应用示范项目简介[J]. 中国计量,2016,(增刊):44-48.
[5]ISO/TS 80004-13:2017(en) Nanotechnologies—Vocabulary—Part 13:Graphene and related two-dimensional (2D) materials[S].
[6]JJF1059测量不确定度评定与表示[S].
[7]倪育才. 实用测量不确定度评定.第2版.[M]. 北京:中国计量出版社,2009.
[8]Wick P, Louw-Gaume A E, Kucki M, et al. Classification Framework for Graphene-Based Materials [J]. Angew Chem Int Ed,2014,53(30):7714-8.
[9]任玲玲,卜天佳,唐琪雯,等. 石墨烯NQI技术调研 [J]. 中国计量,2018,(2):101-104. |