Acta Metrologica Sinica  2018, Vol. 39 Issue (3): 326-331    DOI: 10.3969/j.issn.1000-1158.2018.03.08
Current Issue | Archive | Adv Search |
Error Compensation of Drive System of Vernier Measuring Instrument
CHEN Wang-da1,XU Zhi-ling1,LI Zhi-fei2
1. China Jiliang University, Hangzhou, Zhejiang 310018, China
2. Hangzhou Institute of Calibration and Testing for Quality and Technical Supervision, Hangzhou, Zhejiang 310019, China
Download: PDF (349 KB)   HTML (1 KB) 
Export: BibTeX | EndNote (RIS)      
Abstract  In the verification process of vernier measuring tools, when the dynamic table of the drive system in the verification device is at a low speed, the errors of the friction and backlash nonlinearity are exist between the dynamic work station and the ball screw, so the vernier measuring tools cannot be accurately moved to the test point required by the verification procedure. In order to solve the problem of the errors, the LuGre friction model and adaptive periodic recursive wavelet neural network are used to compensate the friction and backlash nonlinearity.Based on the Liroff stability analysis, the boundedness and convergence of the closed-loop system are guaranteed.The simulation results show that the performance of position tracking is improved, and the control compensation scheme is demonstrated in the driving system of the verification device, the accuracy of positive is improved by 47.6% in positive movement and 49.7% in negative movement.
Key wordsmetrology      vernier gauge      driving system      nonlinear compensation      recurrent wavelet neural networks     
Received: 18 August 2017      Published: 12 April 2018
PACS:  TB921  
Service
E-mail this article
Add to my bookshelf
Add to citation manager
E-mail Alert
RSS
Articles by authors
CHEN Wang-da
XU Zhi-ling
LI Zhi-fei
Cite this article:   
CHEN Wang-da,XU Zhi-ling,LI Zhi-fei. Error Compensation of Drive System of Vernier Measuring Instrument[J]. Acta Metrologica Sinica, 2018, 39(3): 326-331.
URL:  
http://jlxb.china-csm.org:81/Jwk_jlxb/EN/10.3969/j.issn.1000-1158.2018.03.08     OR     http://jlxb.china-csm.org:81/Jwk_jlxb/EN/Y2018/V39/I3/326
Copyright © Editorial Board of Acta Metrologica Sinica
Supported by:Beijing Magtech