|
|
Discussion on the Equations and Calculations in the E-field Calibration Standard of IEEE STD 1309—2013 |
ZHOU Feng1,WANG Jing-wei2,XIONG Yu-fei1,LIU Jian-zhe1,RAN Zhi-qiang1,LU Dai-jun1 |
1.China Telecommunications Technology Lab (National Telecommunication Metrology Station), Beijing 100191, China
2.Unit 69089, PLA, Koel, Xinjiang 841000, China |
|
|
Abstract The theoretical derivation shows that the formula of electric field strength in TEM cell given by IEEE STD 1309—2013, which is commonly used in electric field metrology, is worthy of discussion. At the same time, the correction formula is deduced. The experimental results show that the difference between the corrected formula and the original formula is small under the experimental conditions, and it is difficult to distinguish the difference under the current verification conditions. To further improve the experimental verification, there are two possible technical directions.
|
Received: 08 October 2016
Published: 27 September 2017
|
|
|
|
|
[1]刘潇,李渤,谢鸣.基于TEM小室的探头校准系统不确定度评定[J].计量学报,2015,36(3):318-323.
[2]IEEE. STD 1309—2013:IEEE Standard for Calibration of Electromagnetic Field Sensors and Probes, Excluding Antennas, From 9 kHz to 40 GHz[S].2013.
[3]闫润卿,李英惠.微波技术基础[M].北京:北京理工大学出版社,2008.
[4]Myron L C. Generation of standard EM fields using TEM transmission cells [J]. IEEE Transactions on Electromagnetic Compatibility,1974,16(4):189-195.
[5]Pozar D M. Microwave Engineering[M]. 4th ed. New Jersey: Wiley, 2012.
[6]ETS-Lindgren. EMC Field Probes User Manual[Z]. 2013.
[7]Fan H Q, Kumar S, Daschner R, et al.Subwavelength microwave electric-field imaging using Rydberg atoms inside atomic vapor cells[J]. Optics Letters, 2014,39(10):3030-3033. |
|
|
|