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Measurement uncertainty analysis of CMM in product inspection and conformance testing |
CHEN Xiao-huai,JIANG Rui,WANG Han-bin,XU Lei,CHENG Yin-bao,CHENG Zhen-ying |
School of Instr Sci & Opto-electronics Engineering, Hefei University of Technology, Hefei, Anhui 230009, China |
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Abstract Uncertainty of the CMM in product inspection was evaluated based on the indexes of quantum property by using the method of measurement system analysis. Using the measurement uncertainty as the quality index of product inspection, considering the accuracy of product design, the mathematical model of the misjudgment probability in product inspection was established, based on the tolerance of product design and the measurement result combining with its uncertainty. A product inspection experiment was conducted with CMM . The reasonable evaluation of the measurement system's indexes of quantum property were given, the conformity assessment was carried out based on the uncertainty of product inspection, misjudgment probability was calculated. Finally, the feasibility and operability of the method were verified.
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Received: 05 June 2015
Published: 28 December 2016
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