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| Study on an Two Phase-shifting Profilometry with an Arbitrary Steps Algorithm |
| XU Jian-liang1,ZHOU Ming-an1,FANG Xiao-fen1,2 |
1. School of Mechanical Engineering, Quzhou College and Technology, Quzhou, Zhejiang 324000, China
2. School of Mechanical and Energy Engineering, Zhejiang University, Hangzhou, Zhejiang 310027, China |
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Abstract The traditional PSP was researched. Based on a Gram-Schmidt(GS) orthonormalization approach, an two PSP with an arbitrary steps algorithm is proposed. The phase-shift value has not to be known and can taken any value inside the range. Compared with the existing methods, the method can only have two distorted grating image, and thire phase shift accuracy is not required. Experimental results show that compared with the existing methods, the structure is less demanding for the accuracy of the system, and the proposed method is faster, higher accuracy and more effectively.
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Received: 14 December 2015
Published: 29 July 2016
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2016, Vol. 37 
