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| The Development of the Infrared Spectral Emissivity Measurement of the Semi-transmittance Material |
| ZANG Yan-zhe1,2,DONG Wei2,HUAN Ke-wei1,WANG Jin-hui2,YUAN Zun-dong2 |
1. Changchun University of Science and Technology, Changchun,Jinlin 130022, China
2. National Institute of Metrology, Beijing 100029 |
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Abstract A special sample heater for the semi-transmittance material was constructed to extend the emissivity measurement ability, the temperature range covered 50~200 ℃ and the spectral range cover 3 to 14μm. A grating monochrometer to realize monochromatic spectrum, chopper to get alternating current signal, a digital signal processor lock-in amplifier in conjunction with HgCdTe detector to measure micro voltage signal. The model to measure the semi-transmittance material emissivity was established. A SiO2 glass sample was selected to study its spectral emissivity in the 8 to 14μm wavelength range at the temperature 80 ℃. The standard uncertainty of the emissivity is 0.08.
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2015, Vol. 36 
