Acta Metrologica Sinica  2015, Vol. 36 Issue (3): 238-241    DOI: 10.3969/j.issn.1000-1158.2015.03.04
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Method for Chrominance Correction of Photoelectric Image of Appearance Detection in Printed Circuit Board
ZHANG Jing1,YE Yu-tang1,XIE Yu1,CHANG Yong-xin1,2,LIU Lin1,LIU Juan-xiu1,LUO Ying1,YE Su1
1.University of Electronic Science and Technology of China, Chengdu, Sichuan 610054, China;
2.The Institute of Optics and Electronics the Chinese Academy of Sciences, Chengdu, Sichuan 610209, China
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