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A New Microcalorimeter Design and Evaluation Method Based on Temperature Correction |
CUI Xiao-hai,TAO Yi,LI Yong,ZHU Da-cheng |
National Institute of Metrology, Beijing 100013, China |
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Abstract A new evaluation method based on thermal isolation section waveguide temperature change measurement is provided, and further description of microcalorimeter design based on this method is described.This method corrects the effective efficiency error come from the thermal isolation section dissipated rf power by its temperature change measurement.It doesn’t need the scatter parameter measurement which is the main uncertainty source.This method gets rid of the uncertainty source from the theory.Finally,the temperature change curve of thermal isolation section is provided, which verifies the method is feasible.The measurement result of the thermal isolation section temperature test shows the theory be correct.
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