阿伏加德罗常数测量研究最新进展

doi:10.3969/j.issn.1000-1158.2012.01.09

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Abstract The progress in the determination of the Avogadro constant(N_A) is reviewed. The x-ray crystal density method is considered as one of the most accurate route to determine N_A. According to this method, the molar mass, density and lattice parameter of the single crystal silicon could be measured accurately, then a relative measurement uncertainty 2×10^-8 of N_A is achievable. The determination of the molar mass, the diameter of the silicon sphere, and the thickness of the oxide layer on the silicon sphere are key issues that affect the measurement accuracy of N_A currently,and the focal points for further reseach of the datermination N_A is presented.

Key words： Metrology Avogadro constant Silicon sphere Molar mass Diameter Oxide layer

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TB91

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	Articles by authors
	ZHANG Ji-tao
	LUO Zhi-yong
	ZHAO Ke-gong

Cite this article:

ZHANG Ji-tao,LUO Zhi-yong,ZHAO Ke-gong. Progress in the Determination of the Avogadro Constant[J]. Acta Metrologica Sinica, 2012, 33(1): 39-42.

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http://jlxb.china-csm.org:81/Jwk_jlxb/EN/10.3969/j.issn.1000-1158.2012.01.09 OR http://jlxb.china-csm.org:81/Jwk_jlxb/EN/Y2012/V33/I1/39

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