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Measurement of the Chamber Correction Factor k ch for Absorbed Dose to Water in Superficial Radiotherapy X-rays
JIANG Pengxuan, ZHAO Rui, YANG Zhijun, ZHANG Jian, WU Jinjie, BAO Junxia, DING Weicheng
Acta Metrologica Sinica ›› 2026, Vol. 47 ›› Issue (1) : 132-140.
PDF(3772 KB)
PDF(3772 KB)
Measurement of the Chamber Correction Factor k ch for Absorbed Dose to Water in Superficial Radiotherapy X-rays
The purpose of this study is to investigate the methodology for determining the chamber correction factor k ch and to calculate absorbed dose to water in superficial X-rays radiotherapy accurately. Under superficial X-ray radiotherapy reference radiation qualities with tungsten alloy collimators of varying apertures, this study analyzed the ratio of readings measured in air versus on the surface of a PMMA phantom measured by plane-parallel ionization chambers, PTW23342 and PTW23344. Backscatter factors were determined through Monte Carlo simulations, and the variations of the chamber correction factor k ch with half value layers (HVLs) and radiation beam sizes were measured. Under the four reference radiation qualities (SRT-50a, SRT-50b, SRT-70 and SRT-100), with an SSD (source to skin distance) of 0.45 m and radiation beam sizes of 3.0~7.2 cm. For the PTW23342 plane-parallel ionization chamber: the ratio of readings measured in air to those on the PMMA phantom surface with ranges from 0.870 0 to 0.991 3. The measured results of correction factor k ch are within 1.046~1.094. For the PTW23344 plane-parallel ionization chamber: the ratio of readings measured in air to those on the PMMA phantom surface ranges from 0.901 4 to 0.992 4. The measured correction factor k ch are within 1.053~1.108.
ionizing radiation metrology / superficial X-rays radiotherapy / chamber correction factor k ch / plane-parallel ionization chamber / absorbed dose to water
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