Research on Calibration Method and Device of High Voltage Short-circuit Test Measuring System Based on Arbitrary Waveform Generator
ZHOU Xiao-meng1, LIN Zhi-li2, MIAO Ben-jian2
1.China National Quality Supervision and Testing Center for Smart Grid Transmission and Distribution Equipment, Dongguan, Guangdong 523325, China
2.Guangdong Testing Institute of Product Quality Supervision, Guangzhou, Guangdong 510330, China
Abstract A method for injecting standard short-circuit test waveforms into a multi-channel arbitrary waveform generator to generate simulated actual calibration waveforms and then calibrating the measuring systems was proposed. A calibration device were developed using devices such as field programmable gate array (FPGA) and direct digital synthesizer (DDS). The verification results of the calibration device show that the maximum error of the output frequency and output voltage are 2.1×10-6 and 3×10-3 in the frequency range of 10Hz~200kHz. Repeated output 10 times, the maximum relative standard deviation of the output amplitude is 5.7×10-4, and the maximum relative standard deviation of the amplitude change within 1 year is 1.9×10-4. By using the device for calibration of the actual high voltage short-circuit test measuring system, it is verified that the noise, zero drift and bandwidth of the test waveform have a significant impact on the accuracy of the measuring system.
ZHOU Xiao-meng,LIN Zhi-li,MIAO Ben-jian. Research on Calibration Method and Device of High Voltage Short-circuit Test Measuring System Based on Arbitrary Waveform Generator[J]. Acta Metrologica Sinica, 2020, 41(4): 494-499.
1 IEC 62271-100: 2012 High-voltage switchgear and controlgear-part 100: alternating-current circuit-breakers[S]. Geneva, Switzerland: International Electrotechnical Commission, 2012.
2 Short-Circuit Testing Liaison. Harmonisation of data processing methods for high power laboratories[R]. Coventry, England: Short-Circuit Testing Liaison, 2004.
3 GB/T 16927.2—2013高电压试验技术第2部分:测量系统[S].2013.
4 GB/T 16927.4—2014高电压和大电流试验技术 第4部分:试验电流和测量系统的定义和要求[S]. 2014.
5 YutakaG, MaengH K, AnW, et al. Comparison tests of high current shunts in high power laboratories in Asia with an STL reference shunt[C]//Transmission and Distribution Conference and Exposition. Orlando, USA, IEEE, 2012: 1-8.
6 HisatoshiI, KojiI, EiichiH. Consideration of uncertainty for current measurement and development of test data generator for TRV measurment[C]//2015 3rd International Conference on Electric Power Equipent – Switching Technology. Busan, South Korea, IEEE, 2016: 187-192.
7 王安,阎对丰,崔东,等.大容量试验短时交流电流测量系统有效值的量值溯源和不确定度评定[J].高压电器,2014,50(4):72-76. WangA, YanD F, CuiD, et al. Traceability and uncertainties assessment of short-time alternating current rMS measuring system in high power laboratories[J]. High Voltage Apparatus, 2014, 50(4): 72-76.
8 蔡川, 张俊超, 熊利民, 等. 光谱失配对太阳电池短路电流测量准确性影响分析[J]. 计量学报, 2018, 39(4): 490-492. CaiC, ZhangJ C, XiongL M, et al. Analysis of Spectral Mismatch Error Influences on Measurement of Solar Cell[J]. Acta Metrologica Sinica, 2018, 39(4): 490-492.
9 任稳柱, 冯建华, 葛震, 等. 800kV标准冲击电压测量系统及其不确定度的评定[J]. 计量学报, 2008, 29(2): 153-158. RenW Z, FengJ H, GeZ, et al. 800kV Standard Impulse Voltage Measuring System and the Uncertainty of Evaluation[J]. Acta Metrologica Sinica, 2008, 29(2): 153-158.
10 张煌辉, 林飞鹏, 邵海明, 等. 直流高压电阻分压器泄漏电流测量研究[J]. 计量学报, 2018, 39(1): 83-88. ZhangH H, LinF P, ShaoH M, et al. Ｒesearch on Measuring Leakage Current of DC High-voltage Ｒesistive Divider [J]. Acta Metrologica Sinica, 2018, 39(1): 83-88.
11 周小猛,林志力,苗本健,等.大容量试验短路电流波形参数的测算[J]. 高压电器, 2019, 55(7): 227-234. ZhouX M, LinZ L, MiaoB J, et al. Measurement and Calculation of Short-circuit Current Waveform Parameters for High Power Tests[J]. High Voltage Apparatus, 2019, 55(7): 227-234.
12 宁磊, 淡淑恒. 瞬态恢复电压波形的包络线计算方法[J].高压电器,2016,52(10):27-31. NingLei, DanS H. Envelope calculation method of transient recovery voltage waveform[J]. High Voltage Apparatus, 2016, 52(10): 27-31.
13 周小猛,林志力,刘成许,等.使用逐次逼近法计算瞬态恢复电压波形的包络线[J].高压电器,2018,54(4):159-163. ZhouX M, LinZ L, LiuC X, et al. calculation of the envelope of transient recovery voltage waveform by successive approximation method[J]. High Voltage Apparatus, 2018, 54(4): 159-163.
14 JJG 840—2015 函数发生器[S]. 2015.
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