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| Research in Measurement and Application of New Type Quantum Hall Resistance Sample |
| CAI Jian-zhen, HUANG Xiao-ding, PAN Pan |
| Beijing Orient Institute of Measurement and Test, Beijing, 100086, China |
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Abstract A new type Quantum Hall resistance (NQHR) sample of AsGa epitaxial wafer was developed. The NQHR sample has multi structures. The characters and application area were introduced. The NQHR sample was compared with standard Quantum Hall resistance(QHR) sample using transition comparison measurement method. In laboratory, the measured valve deviation between the two kinds of sample is less than 4×10-8. The experiment proved that the accuracy of NQHR sample and metrology system could satisfy the application of QHR Standard in resistance metrology.
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Received: 19 May 2019
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Corresponding Authors:
Email:caijianzhen@cast514.com
E-mail: caijianzhen@cast514.com
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2020, Vol. 41 
