一种用于毫米波器件本征在片S参数校准的新方法
王一帮,吴爱华,霍晔,梁法国,栾鹏,刘晨,杜静
Development of A New Method for Millimeter-waveintrinsic On-wafer Measurements
WANG Yi-bang,WU Ai-hua,HUO Ye,LIANG Fa-guo,LUAN Peng,LIU Chen,DU Jing
计量学报
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2022, (3): 293
-298
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DOI: 10.3969/j.issn.1000-1158.2022.03.01
