1. College of Optical and Electronic Technology, China Jiliang University, Hangzhou, Zhejiang 310018, China
2. Division of Time and Frequency Metrology, National Institute of Metrology, Beijing 100029, China
3. Key Laboratory of State Administration for Market Regulation (Time Frequency and Gravity Primary Standard), Beijing 100029, China
Abstract:In order to meet the domestic length metrological requirements of optical time-domain reflectometer (OTDR),a fiber length standard based on the principle of the modulation phase shift technique is realized,which adopts a modular design,including the main system units such as the laser driver,signal modulation,photoelectronic conversion and frequency conversion,as well as the length measurement capability of 1550nm window.By independently measuring the fiber temperature correction coefficient and wavelength correction coefficient the normalized corrections of fiber length changes caused by different temperature and wavelength of the test light source in communication window are realized,compared to other research results of fiber length standard reported in China,as well as a complete uncertainty evaluation,which provide experimental evidences,new ideas and methods for the traceability of fiber length in the field of OTDR calibration.The measurement uncertainties are U=(0.016+7.2×10-6L)m(k=2)at 1310nm,and U=(0.028+7.2×10-6L)m(k=2) at 1550nm respectively.And the uncertainty of calibrating by this standard a 14km fiber used to OTDR transmission standard is 0.13m(k=2),which is twice as good as the original device.
ZHU X B, SUN Q S, ZHENG X L,et al. Highly accurate fiber length measurement technique based on modulated phase shift method [J]. Acta Photonica Sinica. 2016, 45(7): 73-77.
LIN L. Accurate measurement of the interference length of fiber-optic Mach-Zundel interferometer [J]. Optoelectronic Technology & Information, 2006(3): 23-27.
GUO S Q, MA J, ZHANG J G, et al. Chaos-pulse hybrid signal optical time-domain reflectometer [J]. Journal of Applied Optics, 2017, 38(4): 569-574.
[3]
WANG Y, WANG X J, LI X L. OTDR-based optical fiber bending and tensile loss analysis[J]. Optoelectronics Letters, 2023, 19(3), 164-169.
[8]
DENNIS T, JIMENEZ J. Optical Fiber Time Delay Comparison Between NIST and LAMETRO [J]. Journal of Research of the National Institute of Standards and Technology, 2021, 126:126040.
ZHANG Y Y, SUN X Q, FU D B, et al. Accurate measurement of fiber length based on Gaussian optical pulse delay technique [J]. Acta Metrologica Sinica, 2015, 36(1): 10-13.
ZHU J G, GUO T H, ZHANG T, et al. Temperature error in length measurement method based on photoelectric oscillator [J]. Infrared and Laser Engineering, 2014, 43(1): 254-259.
SUN X Q, LIU L, FU D B, et al. Calibration device for measuring range and optical return loss of optical time-domain reflectometer [J]. Measurement Technology, 2019(6): 30-32.
[5]
FANG Y, QIAN J, WANG M, et al. Distance scale calibration of optical fiber OTDR [C]// SPIE. Fiber Optic Components and Optical Communication II. Bellingham, US, 1998, 3552: 108-113.
GAO Y S, ZHENG G J. Calibration and Measurement Uncertainty Analysis of Optical Time Domain Reflectometer [J]. Journal of Astronautic Metrology and Measurement, 2010, 30(5): 73-78.
ZHANG Z Y, KUSHIMOTO M, YOSHIKAWA A, et al. Key temperature-dependent characteristics of AlGaN-based UV-C laser diode and demonstration of room-temperature continuous-wave lasing[J]. Applied Physics Letters, 2022, 121(22): 222103.
[16]
YAN Y, ZHENG Y, CHEN S, et al. Research on the influence mechanism and modification technology of UV-curing adhesive on the HPLD thermal-induced misalignment [J]. International Journal of Adhesion and Adhesives, 2023, 121: 103320.
[17]
HE M, XU M, REN Y, et al. High-performance hybrid silicon and lithium niobate Mach-Zehnder modulators for 100 Gbit/s and beyond [J]. Nature Photonics, 2019, 13(5): 359-364.
LI J H, SUN J P, LI T, et al. Research on the calibration method of NTC thermistor thermometers for integrated circuits [J]. Acta Metrologica Sinica, 2023, 44(8): 1208-1213.
MEI M C, HAN Q N, SHI Y, et al. Miniaturized silicon-based microcavity photon temperature measurement system [J]. Acta Metrologica Sinica, 2023, 44(7): 1208-1213.