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计量学报  2022, Vol. 43 Issue (6): 811-817    DOI: 10.3969/j.issn.1000-1158.2022.06.16
  电离辐射、标准物质与生物计量 本期目录 | 过刊浏览 | 高级检索 |
基于MCNP的X光机模拟及足跟效应修正
严永强1,3,吴金杰3,金尚忠1,2,赵瑞3
1.中国计量大学光学与电子科技学院,浙江 杭州 310018
2.浙江省现代计量测试技术及仪器重点实验室,浙江 杭州 310018
3.中国计量科学研究院,北京 100029
Simulation of X-ray Machine and Correction of Heel Effect Based on MCNP
YAN Yong-qiang1,3,WU Jin-jie3,JIN Shang-zhong1,2,ZHAO Rui3
1. School of Optical and Electronic Technology, China Jiliang University, Hangzhou, Zhejiang 310018, China
2. Key Laboratory of Zhejiang Province on Modern Measurement Technology and Instrument,  Hangzhou, Zhejiang 310018, China; 3. National Institute of Metrology, Beijing 100029, China
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摘要 为修正X射线管的足跟效应,根据常用的X射线管参数,基于MCNP建立了X光机仿真模型,模仿光机成像系统增感屏,建立了169个像素的探测器阵列,并利用该阵列探究了X射线管的足跟效应现象,采用多项式拟合分段修正的方法设计了足跟效应过滤片HEF,对足跟效应照度过高的区域进行匀整修正。通过平面过滤片与HEF的通量分布对比,发现HEF成功地将阴阳极轴线方向-12°至19°的范围修正到无过滤片时强度的60%,该区域通量的最大相对误差小于3%,实现较大匀整面积。通过模拟成像对比分析发现,经过HEF修正后的X光机,大大提高了物体分辨的能力。所提出的对特定X光管参数和成像阵列面足跟效应的修正方法具有一定的实用性与可推广性,对X光机的设计和使用具有一定的参考价值。
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严永强
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赵瑞
关键词 计量学X光机足跟效应蒙特卡罗模拟    
Abstract:In order to modify the anode heel effect of X-ray tube, according to the common parameters of X-ray tube, a simulation model of X-ray machine is established based on MCNP, and a detector array of 169 pixels is built to simulate the intensifying screen of the imaging system of X-ray machine, and the anode heel image of X-ray tube is explored by using the array. The heel effect filter HEF is designed by polynomial fitting and subsection correction method.The area with high illumination of heel effect is corrected. By comparing the flux distribution between the plane filter and HEF, it is found that HEF successfully corrects the range of -12° to 19° in the direction of the axis of the cathode and anode poles to 60% of the intensity without the filter, and the maximum relative error of the flux in this area is less than 3%, achieving a large uniform area. Through the comparative analysis of the simulated imaging, it is found that the X-ray machine modified by HEF greatly improves the resolution ability of the object. The proposed correction method for the specific X-ray tube parameters and the anode heel effect of the imaging array surface has certain practicability and generalization, and has certain reference value for the design and use of the X-ray machine.
Key wordsmetrology;X-ray machine    heel effect    Monte Carlo simulation
收稿日期: 2020-05-27      发布日期: 2022-06-30
PACS:  TB98  
基金资助:国家重点研发计划(2017YFF0205101)
通讯作者: 吴金杰(1981-),男,浙江东阳人,中国计量科学研究院研究员,主要从事电离辐射计量研究。Email: wujj@nim.ac.cn     E-mail: wujj@nim.ac.cn
作者简介: 严永强(1996-),男,浙江衢州人,硕士,研究方向为环境辐射监测。Email: 845113677@qq.com
引用本文:   
严永强,吴金杰,金尚忠,赵瑞. 基于MCNP的X光机模拟及足跟效应修正[J]. 计量学报, 2022, 43(6): 811-817.
YAN Yong-qiang,WU Jin-jie,JIN Shang-zhong,ZHAO Rui. Simulation of X-ray Machine and Correction of Heel Effect Based on MCNP. Acta Metrologica Sinica, 2022, 43(6): 811-817.
链接本文:  
http://jlxb.china-csm.org:81/Jwk_jlxb/CN/10.3969/j.issn.1000-1158.2022.06.16     或     http://jlxb.china-csm.org:81/Jwk_jlxb/CN/Y2022/V43/I6/811
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