次级固定点进一步分度温度计应用于温度校准已成为减小温度量值传递不确定度的重要方法。围绕Ga-In二元合金,以高复现水平为目标,详细介绍了大尺寸固定点容器研制、固定点灌注过程,开展了固定点复现性、亚配比剩余镓温坪验证实验研究;采用了切线交点法、均值法、三次多项式拟合法3种相变温度取值方法对Ga-In固定点进行了评价和分析,并使用3支标准铂电阻温度计对Ga-In共晶固定点温度进行了赋值。结果表明:Ga-In共晶固定点温坪可持续20h以上,复现性优于0.15mK;采用切线交点法赋值得到Ga-In共晶固定点相变温度为15.6494℃,扩展不确定度为0.76mK(k=2)。
Abstract
The application of secondary fixed point thermometers to temperature calibration has become an important method to reduce the uncertainty of temperature transmission. Focusing on Ga-In binary alloys, aiming at high reproducibility, the development of large-size fixed-point containers and the process of fixed-point infusion are introduced in detail, and the verification experiments on the reproducibility of fixed-points and the excessive gallium temperature plateau of sub-mixture ratio are carried out. The performance of Ga-In fixed point is evaluated and analyzed by three methods of the phase transition temperature determination including the tangent intersection method, the mean value method, and the polynomial fitting method, and then the Ga-In fixed point phase transition temperature is assigned using three standard platinum resistance thermometers. The results show that the Ga-In eutectic fixed point temperature plateau can last for more than 20hours, and the experimental reproducibility is better than 0.15mK. The fixed point phase transition temperature of Ga-In eutectic determined with the tangent intersection method is 15.6494℃, the expanded uncertainty is 0.76mK (k=2).
关键词
计量学 /
90国际温标 /
Ga-In二元合金 /
微型共晶固定点 /
相变温度
Key words
metrology /
ITS-90 /
Ga-In binary alloy /
mini eutectic fixed point /
phase transition temperature
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基金
中国计量科学研究院基本科研业务费重点领域项目(AKYZD2004-3)
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