Measurement of Micro Transverse Spacing Using Single Frequency-stabilized Laser
LIU Yu-zhang1,GAO Hong-tang1,2,CHENG Yin-bao1,WANG Zhong-yu1
1. School of Instrumentation Science & Opto-Electronics Engineering, Beihang University, Beijing 100191, China
2. National Institute of Metrology, Beijing 100029, China
Abstract:An interference system for the use of measuring micro transverse spacing is described. A highly frequency-stabilized laser of the wavelength of 532nm and a 633nm wavelength laser of relatively low level of wavelength uncertainty are brought into the system as optical sources. The charge coupled device(CCD) sensor is used in the system to get the interference graph. Some image processing methods are introduced to digitally enhance the interference image and calculate the fractional part of the interference fringe. The transverse distance is calculated by the method of exact fractions. By introducing some software technology to enhance the interference graph, a relatively high accuracy micro transverse spacing measurement can be realized with simple experimental condition.
[1]Gao H T, Wang Z Y, Cheng Y B, et al. A Practical Positioning Method in End-Plate Surface Distance Measurement with Nan-Meter Precision[J]. Applied Sciences, 2019, 9(22): 4970-4982.
[2]Ikonen E, Kauppinen J, Korkolainen T, et al. Interferometric calibration of gauge blocks by using one stabilized laser and a white-light source [J]. Applied Optics, 1991, 30(31): 4477-4485.
[3]Bartl J, Fíra R. Proposal of the 1m laser interferometer modification in the Slovak Institute of Metrology [J]. Proc of SPIE, 2007, 1(6609): 1-4.
[4]苏俊宏. 基于干涉法的量块长度测量技术研究 [D]. 南京: 南京理工大学, 2006.
[5]张旭东, 刘香斌, 王世婕, 等. 新型移相量块干涉仪的研制[J]. 计量学报, 2017, 38(3): 257-261
Zhang X D, Liu X B, Wang S J, et al. The Development of the Phase Stepping Gauge Block Interferometer [J]. Acta Metrologica Sinica, 2017, 38(3): 257-261.
[6]邵宏伟, 方占军, 王强, 等. 新型长距离无导轨激光干涉仪[J]. 计量学报, 2007, 28(2): 110-113.
Shao H Y, Fang Z J, Wang Q, et al. A Novel Non-guideway Laser Interferometer for Absolute Long Distance Measurement [J]. Acta Metrologica Sinica, 2007, 28(2): 110-113.
[7]邵宏伟, 刘香斌, 王雁, 等. 一等大量块(125~1000mm)检定装置[J]. 计量学报, 2004, 25(3): 198-202.
Shao H W, Liu X B, Wang Y, et al. The Calibration Interferometer for the First Grade Long Gauge Blocks (125~1000mm) [J]. Acta Metrologica Sinica, 2004, 25(3): 198-202.
[8]Konstantinos F, David P, Catherine E. Method of excess fractions with application to absolute distance metrology: analytical solution. [J]. Applied optics, 2013, 52(23): 5758-5765.
[9]Agurok I P. Analytical solution of excess fractions method in absolute distance interferometry[C]//SPIE Optics and Photonics.Son Diego, USA,2003:373-380.
[10]冯小二, 王新赛, 李明明. 基于多尺度形态小波变换的红外图像边缘增强算法[J]. 电子测试, 2019, 10(19): 43-45.
Feng X E, Wang X S, Li M M. Infrared image edge enhancement algorithm based on multi-scale morphological wavelet transform [J]. Electronic Test, 2019, 10(19): 43-45.
[11]李继泉, 时勤功, 李井文. 一种宽动态范围下的红外图像局部细节增强算法[J]. 激光与红外, 2019, 49(8): 1026-1032.
Li J Q, Shi Q G, Li J W. A local details enhancement algorithm for high dynamic range infrared images [J]. Laser & Infrared, 2019, 49(8): 1026-1032.
[12]ISO/IEC GUIDE 98-3: 2008, Uncertainty of measurement—Part 3: Guide to the expression of uncertainty in measurement [S].
[13]程银宝, 陈晓怀, 王汉斌, 等. 基于精度理论的测量不确定度评定与分析[J]. 电子测量与仪器学报, 2016, 30(8): 1175-1182.
Cheng Y B, Chen X H, Wang H B, et al. Measurement uncertainty estimation and analysis based on accuracy theory[J]. Journal of Electronic Measurement and Instrumentation, 2016, 30(8): 1175-1182.
[14]Zivkovic V, Zelenika S, Stefanovic G. Uncertainty evaluation for the gauge blocks calibration using the modified DMDM gauge block interferometer [J]. International Journal of Metrology & Quality Engineering, 2012, 3(1): 19-27.
[15]程银宝,陈晓怀,王中宇, 等. CMM形状测量任务的不确定度分析与评定[J]. 计量学报, 2020, 41(2): 134-138.
Cheng Y B, Chen X H, Wang Z Y, et al. Uncertainty Analysis and Evaluation of Form Measurement Task for CMM[J]. Acta Metrologica Sinica, 2020, 41(2): 134-138.
[16]李天初. 试析光干涉测量几何长度的相对不确定度极限[J]. 计量学报, 1999, 20(1): 37-43.
Li T C. Limits on the Relative Uncertainty of Measuring Physical Length by Means of Optical Interferometry. Acta Metrologica Sinica, 1999, 20(1): 37-43.