铂丝的位错是影响标准铂电阻温度计性能稳定性的重要因素之一。从微观角度出发,借助X射线衍射(XRD)分析方法,开展了退火时间对铂丝位错密度影响的研究,并利用标准铂电阻温度计退火实验数据进行了验证。结果表明:实际用于标准铂电阻温度计直径为0.07mm的新制铂丝(纯度99.999%)平均位错密度随着退火时间呈指数减小,经过100h退火后位错密度从1012cm-2下降到1011cm-2,300h后其位错密度基本保持稳定;新制标准铂电阻温度计在退火前300h其水三相点电阻值明显减小,退火300h后水三相点值变化量小于3mK并趋于平稳,此结果从热处理时间上与铂丝位错实验结果基本吻合。研究结果为标准铂电阻温度计制作工艺的提升及计量检定规程的修订提供技术支撑
Abstract
Dislocation within platinum wire is one of the important factors affecting the stability of standard platinum resistance thermometers (SPRTs). From the microscopic point of view, the effect of annealing time on the dislocation density of platinum wire was studied by X-ray diffraction (XRD) analysis method, and verified by the SPRT annealing experimental data. The results show that the average dislocation density of the new platinum wire (purity 99.999%) with a diameter of 0.07mm goes down exponentially with the annealing time. After 100h annealing, the dislocation density decreases from 1012cm-2 to 1011cm-2, and then its dislocation density remains basically stable after 300h. The resistance of the new SPRTs have a significant decrease at the water triple point through previous 300h annealing, and the difference between before and after 300h annealing is less than 3mK and tends to be stable. The SPRTs annealing experiments and dislocation test results get good agreement at the heat treatment time. The research results provide technical support for the improvement of the standard platinum resistance thermometer manufacturing process and the revision of the metrological verification regulations.
关键词
计量学 /
标准铂电阻温度计 /
位错 /
退火时间 /
90国际温标 /
X射线衍射法
Key words
metrology /
standard platinum resistance thermometer /
dislocation /
annealing time /
ITS-90 /
X-ray diffraction
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基金
国家重点研发计划项目(2017YFF0205904);国家自然科学基金(51576181)
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