1. School of Mechanical Engineering, Yanshan University, Qinhuangdao, Hebei 066004, China
2. Innovation Center of Heavy-duty Intelligent Manufacturing Equipment in Hebei Province, Qinhuangdao, Hebei 066004, China
Abstract:The influence of scanning parameters on the atomic force microscopy(AFM) imaging quality is reviewed and analyzed. A novel amplitude error indicator that is employed to evaluate the AFM imaging quality is proposed. The coupling effect of scanning parameters on imaging quality is investigated with experiments. The result reveals the interaction effect between the three scanning parameters like scanning frequency(fs), integral gain(I), and amplitude set point(S), i.e. the larger I and fs can be set at low S, which implies that the optimal balance between imaging quality and measurement efficiency is achievable. The result also provides practical guidelines for the reasonable setting of scanning parameters in AFM imaging.
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