Research on Calibration Method and Device of High Voltage Short-circuit Test Measuring System Based on Arbitrary Waveform Generator
ZHOU Xiao-meng1, LIN Zhi-li2, MIAO Ben-jian2
1.China National Quality Supervision and Testing Center for Smart Grid Transmission and Distribution Equipment, Dongguan, Guangdong 523325, China
2.Guangdong Testing Institute of Product Quality Supervision, Guangzhou, Guangdong 510330, China
Abstract：A method for injecting standard short-circuit test waveforms into a multi-channel arbitrary waveform generator to generate simulated actual calibration waveforms and then calibrating the measuring systems was proposed. A calibration device were developed using devices such as field programmable gate array (FPGA) and direct digital synthesizer (DDS). The verification results of the calibration device show that the maximum error of the output frequency and output voltage are 2.1×10-6 and 3×10-3 in the frequency range of 10Hz~200kHz. Repeated output 10 times, the maximum relative standard deviation of the output amplitude is 5.7×10-4, and the maximum relative standard deviation of the amplitude change within 1 year is 1.9×10-4. By using the device for calibration of the actual high voltage short-circuit test measuring system, it is verified that the noise, zero drift and bandwidth of the test waveform have a significant impact on the accuracy of the measuring system.
周小猛, 林志力, 苗本健. 基于任意波形发生器的高压短路试验测量系统校准方法和装置的研究[J]. 计量学报, 2020, 41(4): 494-499.
ZHOU Xiao-meng, LIN Zhi-li, MIAO Ben-jian. Research on Calibration Method and Device of High Voltage Short-circuit Test Measuring System Based on Arbitrary Waveform Generator. Acta Metrologica Sinica, 2020, 41(4): 494-499.
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